Display device with crack-sensing line

ABSTRACT

A display device includes a substrate having a display area and a non-display area. A plurality of pixels is disposed in the display area of the substrate. A plurality of data lines is connected to the plurality of pixels. A crack sensing line is connected to at least one of the plurality of data lines. The crack sensing line is disposed in the non-display area of the substrate. A dummy pattern layer is connected to the crack sensing line.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority to and the benefit of Korean PatentApplication No. 10-2016-0094800, filed in the Korean IntellectualProperty Office on Jul. 26, 2016, the entire contents of which areincorporated by reference herein.

TECHNICAL FIELD

The present disclosure relates to a display device, and morespecifically, to a display device having a crack-sensing line disposedthereon.

DISCUSSION OF THE RELATED ART

Flat panel displays such as liquid crystal display (LCD) devices andorganic light emitting diode (OLED) display devices tend to be lightweight and small and are therefore well suited for portable electronicdevices such as mobile phones, smart phones, wearable devices, satelliteguidance systems, digital cameras, e-book readers, portable gameconsoles, and the like.

Flat panel displays such as LCDs and OLEDs may be manufactured toinclude a flexible/bendable substrate and then the displays may be bentinto a desired shape and position within the portable electronicdevices.

During the manufacturing process, a crack may be generated in thesubstrate of the display device as the flat panel display is bent. Whilelarge cracks may be more easily spotted, smaller cracks may be difficultto detect and might not adversely affect the performance of the displaydevice, at least not at first. However, the crack may become larger withthe passage of time, and moisture may penetrate inside the displaydevice through the crack. Eventually these display devices may fail.

To detect even small cracks along the display device substrate, a cracksensing line may be disposed. However, while manufacturing the displaydevice, the substrate may be moved along rollers, and static electricitymay result. The crack sensing line may be connected to a thin filmtransistor disposed in a display area, and static electricity on thecrack sensing line may damage the thin film transistor connectedthereto. As the crack sensing line may be disposed closely to otherwires, static electricity on the crack sensing line may cause a shortcircuit between the crack sensing line and the adjacent wires.

SUMMARY

A display device includes a substrate having a display area and anon-display area. A plurality of pixels is disposed in the display areaof the substrate. A plurality of data lines is connected to theplurality of pixels. A crack sensing line is connected to at least oneof the plurality of data lines. The crack sensing line is disposed inthe non-display area of the substrate. A dummy pattern layer isconnected to the crack sensing line.

A display device includes a flexible substrate. A plurality of pixels isdisposed on the flexible substrate. A plurality of data lines isdisposed on the substrate and is connected to the plurality of pixels. Afirst crack sensing line is connected to the plurality of data lines. Adummy pattern layer is disposed between the first crack sensing line andthe flexible substrate.

BRIEF DESCRIPTION OF THE DRAWINGS

A more complete appreciation of the present disclosure and many of theattendant aspects thereof will be readily obtained as the same becomesbetter understood by reference to the following detailed descriptionwhen considered in connection with the accompanying drawings, wherein:

FIG. 1 is a top plan view illustrating a display device according to anexemplary embodiment of the present inventive concept;

FIG. 2 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept;

FIG. 3 is a cross-sectional view illustrating a non-display area shownin FIG. 2 taken along a line III-III;

FIG. 4 is a cross-sectional view illustrating a non-display area shownin FIG. 2 taken along a line IV-IV;

FIG. 5 is a cross-sectional view illustrating a display area of adisplay device according to an exemplary embodiment of the presentinventive concept;

FIG. 6 is a waveform diagram illustrating signals applied to a displaydevice according to an exemplary embodiment of the present inventiveconcept;

FIG. 7 to FIG. 9 are top plan views illustrating a display deviceaccording to an exemplary embodiment of the present inventive concept;

FIG. 10 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept;

FIG. 11 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept;

FIG. 12 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept;

FIG. 13 is a cross-sectional view illustrating a non-display area ofFIG. 12 taken along a line XIII-XIII;

FIG. 14 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept;

FIG. 15 is a cross-sectional view illustrating a non-display area ofFIG. 14 taken along a line XV-XV;

FIG. 16 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept;

FIG. 17 is a cross-sectional view illustrating a non-display area ofFIG. 16 taken along a line XVII-XVII; and

FIG. 18 is a cross-sectional view illustrating a non-display area of adisplay device according to an exemplary embodiment of the presentinventive concept.

DETAILED DESCRIPTION

The present invention will be described more fully hereinafter withreference to the accompanying drawings, in which exemplary embodimentsof the invention are shown. As those skilled in the art would realize,the described embodiments may be modified in various different ways, allwithout departing from the spirit or scope of the present invention.

Like reference numerals may designate like elements throughout thespecification.

In the drawings, the thickness of layers, films, panels, regions, areas,etc., may be exaggerated for clarity.

It will be understood that when an element such as a layer, film,region, area, or substrate is referred to as being “on” another element,it can be directly on the other element or intervening elements may alsobe present.

A display device according to an exemplary embodiment will be describedbelow with reference to FIG. 1.

FIG. 1 is a top plan view illustrating a display device according to anexemplary embodiment of the present inventive concept.

As shown in FIG. 1, the display device according to an exemplaryembodiment includes a substrate 110.

The substrate 110 may be made of an insulating material such as glass,polymer, stainless steel, etc. The substrate 110 may be flexible,stretchable, foldable, bendable, or rollable. As the substrate 110 maybe flexible, stretchable, foldable, bendable, or rollable, the displaydevice may be entirely flexible, stretchable, foldable, bendable, orrollable. For example, the substrate 110 may be a flexible film typeincluding a resin such as polyimide.

The substrate 110 includes a display area DA displaying an image and anon-display area NDA in which an image is not displayed. A drivertransmitting signals to drive the display area DA may be disposed withinthe non-display area NDA. The non-display area NDA is disposed at anedge of the display area DA. FIG. 1 shows the non-display area NDAenclosing the display area DA, however the present invention is notlimited thereto. The non-display area NDA may be disposed at both edgesof the display area DA, and the non-display area NDA may be disposed ata left edge and a lower edge of the display area DA.

A plurality of pixels R, G, and B and a plurality of gate lines G1, G2,. . . , G(n-1), and Gn and a plurality of data lines D1, D2, D3, D4, D5,D6, . . . , D(m-5), D((m-4)), D((m-3)), D((m-2)), D(m-1), and Dm thatare connected to the plurality of pixels R, G, and B are disposed on thedisplay area DA of the substrate 110.

The pixels R, G, and B are the smallest units for displaying the image,and each pixel R, G, B, may be capable of displaying only a singlecolor. The plurality of pixels R, G, and B are disposed in a matrixshape along a row direction and a column direction.

The plurality of gate lines G1, G2, . . . , G(n-1), Gn may be disposedwith a predetermined interval from each other, and each of the gatelines G1, G2, . . . G(n-1), and Gn extends substantially along the rowdirection. Those pixels of the plurality of pixels R, G, and B that areadjacent in the column direction are connected to the same gate linesG1, G2, . . . , G(n-1), and Gn.

The gate lines G1, G2, . . . , G(n-1), and Gn are connected to a gatedriver and receive a gate signal including a gate-on voltage and agate-off voltage from the gate driver. The gate driver may be disposedon the non-display area NDA of the substrate 110.

The plurality of data lines D1, D2, D3, D4, D5, D6, . . . , D(m-5),D(m-4), D(m-3), D(m-2), D(m-1), and Dm may be disposed with apredetermined interval from each other, and each of the data lines D1,D2, D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), andDm extend approximately along the column direction. Those pixels of theplurality of pixels R, G, and B that are adjacent in the columndirection are connected to the same data lines D1, D2, D3, D4, D5, D6, .. . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm.

The data lines D1, D2, D3, D4, D5, D6, . . . , D(m-5), D(m-4), D(m-3),D(m-2), D(m-1), and Dm are connected to a data driver and receive a datasignal from the data driver. The data driver may be disposed on thenon-display area NDA of the substrate 110. The data lines D1, D2, D3,D4, D5, D6, . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dmtransmit the data signal to the pixels R, G, and B, respectively,thereby the pixels R, G, and B may respectively represent apredetermined luminance.

Each of the pixels R, G, and B are connected to each of the gate linesG1, G2, . . . , G(n-1), and Gn and each of the data lines D1, D2, D3,D4, D5, D6, . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm bythe thin film transistor. When the gate-on voltage is applied to thegate lines G1, G2, . . . , G(n-1), and Gn, the thin film transistor isturned on such that the data signal is applied to each pixel through thedata lines D1, D2, D3, D4, D5, D6, . . . , D(m-5), D(m-4), D(m-3),D(m-2), D(m-1), and Dm.

A first test gate line TG1, a second test gate line TG2, a first testsignal line TD1, and a plurality of second test signal lines TD2 a, TD2b, and TD2 c are disposed in the non-display area NDA of the substrate110.

The first test gate line TG1 and the first test signal line TD1 may bedisposed in parallel to each other along the row direction. FIG. 1illustrates the first test gate line TG1 and the first test signal lineTD1 disposed at a lower edge of the substrate 110, however the presentinvention is not limited thereto, and the positions of the first testgate line TG1 and the first test signal line TD1 may be variouslychanged.

The second test gate line TG2 and the second test signal lines TD2 a,TD2 b, and TD2 c may be disposed in parallel along the row direction.FIG. 1 illustrates the second test gate line TG2 and the second testsignal lines TD2 a, TD2 b, and TD2 c disposed on the upper edge of thesubstrate 110, however the present invention is not limited thereto, andthe positions of the second test gate line TG2 and the second testsignal lines TD2 a, TD2 b, and TD2 c may be variously changed.

A first switching element Q1 connected to the first test gate line TG1,the first test signal line TD1, and the data lines D1, D2, D3, D4, D5,D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm is disposed inthe non-display area NDA of the substrate 110. The plurality of firstswitching elements Q1 may be disposed on the substrate 110, and eachfirst switching element Q1 may be connected to six among the pluralityof data lines D1, D2, D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3),D(m-2), D(m-1), and Dm.

In the non-display area NDA of the substrate 110, a second switchingelement Q2 is connected to the second test gate line TG2, the secondtest signal lines TD2 a, TD2 b, and TD2 c, and the data lines D1, D2,D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm.Three second test signal lines TD2 a, TD2 b, and TD2 c and the pluralityof second switching elements Q2 may be disposed on the substrate 110. Anumber of the second switching elements Q2 may correspond to a number ofthe data lines D1, D2, D3, D4, DS, D6 . . . , D(m-5), D(m-4), D(m-3),D(m-2), D(m-1), and Dm. Each second switching element Q2 is connected toone of the plurality of data lines D1, 132, 133, D4, D5, D6 . . . ,D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm. The adjacent secondswitching elements Q2 may be connected to the different second testsignal lines TD2 a, TD2 b, and TD2 c.

The first crack sensing line CD1 and the second crack sensing line CD2are disposed in the non-display area NDA of the substrate 110. The firstcrack sensing line CD1 and the second crack sensing line CD2 aredisposed on both sides of the plurality of pixels R, G, and B. The firstcrack sensing line CD1 may be disposed at the left edge of the substrate110 and the second crack sensing line CD2 may be disposed at the rightedge of the substrate 110. The first crack sensing line CD1 and thesecond crack sensing line CD2 may be extended in parallel to each other.

The first crack sensing line CD1 and the second crack sensing line CD2are disposed at the partial region of the upper edge of the substrate110, however the present invention is not limited thereto, and the firstcrack sensing line CD1 and the second crack sensing line CD2 may bedisposed to enclose most of the upper edge of the substrate 110 and maybe disposed at the lower edge. The first crack sensing line CD1 and thesecond crack sensing line CD2 may be formed of the same layer as themetal layer disposed at the display area DA of the substrate 110.

A first end of the first crack sensing line CD1 is connected to one ofthe second test signal lines TD2 a, TD2 b, and TD2 c. For example, thefirst end of the first crack sensing line CD1 may be connected to thesecond test signal line TD2 b disposed at a second row from the upperpart of the substrate 110. A second end of the first crack sensing lineCD1 is connected to one of the data lines D1, D2, D3, D4, D5, D6 . . . ,D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm through the secondswitching element Q2. For example, the second end of the first cracksensing line CD1 may be connected to the data line D2 (hereinafter,referred to as ‘a first data line’) disposed at a second column from theleft edge of the substrate 110.

The first crack sensing line CD1 starts from the first end connected tothe second test signal line TD2 b and extends in the first direction R1along the upper edge and the left edge of the substrate 110, and thenextends in a second direction that is opposite to the first direction R1as a changed direction and is connected to the first data line D2 by thesecond end.

The first end of the second crack sensing line CD2 is connected to oneof the second test signal lines TD2 a, TD2 b, and TD2 c. For example,the first end of the second crack sensing line CD2 may be connected tothe second test signal line TD2 b disposed at the second row from theupper edge of the substrate 110. The second end of the second cracksensing line CD2 is connected to one of the data lines D1, D2, D3, D4,D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm throughthe second switching element Q2. For example, the second end of thesecond crack sensing line CD2 may be connected to the data line D(m-1)(hereinafter, referred to as ‘a second data line’) disposed at thesecond column from the right edge of the second end.

The second crack sensing line CD2 starts from the first end connected tothe second test signal line TD2 b and extends in the first direction R1along the upper edge and the right edge of the substrate 110, and thenextends in the second direction R2, which is the opposite direction tothe first direction R1, and is connected to the second data line D(m-1)by the second end.

The first crack sensing line CD1 and the second crack sensing line CD2are disposed at the non-display area NDA adjacent to both edges of thedisplay area DA, and respectively start from the first ends and extendin the first direction R1 and then again extend in the second directionR2 to reach the second end, thereby forming a hemi-ring shape.

A common voltage line ELVSS is disposed in the non-display area NDA ofthe substrate 110. The common voltage line ELVSS may be disposed toenclose at least part of the display area DA. For example, the commonvoltage line ELVSS may be disposed so as to enclose the left edge, theupper edge, and the right edge of the display area DA. The commonvoltage line ELVSS may be close to the first crack sensing line CD1 andthe second crack sensing line CD2. The common voltage line ELVSS mayinclude a part disposed between the first crack sensing line CD1 and thedisplay area DA and a part disposed between the second crack sensingline CD2 and the display area DA. The common voltage line ELVSS mayextend in parallel to the first crack sensing line CD1 and the secondcrack sensing line CD2. A common voltage is applied to the commonvoltage line ELVSS. The voltage applied to the common voltage line ELVSSmay be different from a voltage applied to the first crack sensing lineCD1 and the second crack sensing line CD2.

Next, the non-display area of the display device, according to anexemplary embodiment of the present inventive concept, will be describedwith reference to FIG. 2 to FIG. 4.

FIG. 2 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept. FIG. 3 is a cross-sectional view of a non-display area shown inFIG. 2, taken along a line III-III. FIG. 4 is a cross-sectional view ofa non-display area shown in FIG. 2, taken along a line IV-IV.

As shown in FIG. 2, a first crack sensing line CD1 and a dummy patternlayer 138 overlapping the first crack sensing line CD1 are disposed inthe non-display area NDA of the substrate 110.

The dummy pattern layer 138 may be made of a semiconductor material. Thedummy pattern layer 138 may be made of a material having higherresistance than that of the first crack sensing line CD1.

A buffer layer 120 may be disposed between the substrate 110 and thedummy pattern layer 138. The buffer layer 120 may include a siliconnitride (SiNx) or a silicon oxide (SiOx).

The first crack sensing line CD1 may be made of a metal material. Thefirst crack sensing line CD1 overlaps the dummy pattern layer 138, andthe first crack sensing line CD1 is disposed on the dummy pattern layer138. The first crack sensing line CD1 and the dummy pattern layer 138extend in the same direction and may have substantially the same width.The first crack sensing line CD1 and the dummy pattern layer 138 mayhave different widths in a partial region or an entire region.

A first gate insulating layer 141 and a second gate insulating layer 142may be disposed between the dummy pattern layer 138 and the first cracksensing line CD1. The first gate insulating layer 141 and the secondgate insulating layer 142 may be made of an inorganic insulatingmaterial such as a silicon nitride and/or a silicon oxide. Twoinsulating layers are deposited between the dummy pattern layer 138 andthe first crack sensing line CD1, however the present exemplaryembodiment is not limited thereto. An insulating layer made of a singlelayer or three or more insulating layers may be disposed between thedummy pattern layer 138 and the first crack sensing line CD1.

A connection electrode 178 overlapping the dummy pattern layer 138 andthe first crack sensing line CD1 is disposed on the substrate 110. Theconnection electrode 178 may be disposed on the dummy pattern layer 138and the first crack sensing line CD1. The connection electrode 178 maybe made of a metal material.

An interlayer insulating layer 160 may be disposed between the firstcrack sensing line CD1 and the connection electrode 178. The first gateinsulating layer 141, the second gate insulating layer 142, and theinterlayer insulating layer 160 may each be disposed between the dummypattern layer 138 and the connection electrode 178. The interlayerinsulating layer 160 may be made of the organic insulating material orthe inorganic insulating material.

The interlayer insulating layer 160 has a first contact hole 185overlapping the first crack sensing line CD1. The first gate insulatinglayer 141, the second gate insulating layer 142, and the interlayerinsulating layer 160 have a second contact hole 186 overlapping thedummy pattern layer 138. The second contact hole 186 does not overlapthe first crack sensing line CD1. For example, the second contact hole186 is disposed at a part where the dummy pattern layer 138 and thefirst crack sensing line CD1 do not overlap. The connection electrode178 is connected to the first crack sensing line CD1 through the firstcontact hole 185 and to the dummy pattern layer 138 through the secondcontact hole 186. Accordingly, the first crack sensing line CD1 isconnected to the dummy pattern layer 138 through the connectionelectrode 178.

In the process of manufacturing the display device, according to anexemplary embodiment of the present inventive concept, while moving thesubstrate 110, static electricity may be generated on the first cracksensing line CD1. The first crack sensing line CD1 is connected to thefirst data line D2, and the characteristics of the thin film transistorconnected to the first data line D2 may be changed by the staticelectricity. For example, a threshold voltage of the thin filmtransistor may be changed. Moreover, there is a risk that movement ofthe charge may be generated by a potential difference between the firstcrack sensing line CD1 and the adjacent common voltage line ELVSS, or arisk that the first crack sensing line CD1 and the common voltage lineELVSS may be shorted.

According to an exemplary embodiment of the present inventive concept,the dummy pattern layer 138 is made of a material having a largerresistance than that of the first crack sensing line CD1, and the firstcrack sensing line CD1 and the dummy pattern layer 138 are connected toeach other. Accordingly, even if the static electricity is generated onthe first crack sensing line CD1, a peak current value may be decreasedby an RC delay in the dummy pattern layer 138. Accordingly, thecharacteristics of the thin film transistor connected to the first cracksensing line CD1 may be maintained and short circuits between the firstcrack sensing CD1 and the adjacent wires may be prevented.

The second crack sensing line CD2 and the surrounding constituentelements may be substantially similar to the first crack sensing lineCD1 and its surrounding constituent elements and so to the extent thatthe second crack sensing line CD2 and its surrounding constituents arenot further described, it may be assumed that the description of thefirst crack sensing line CD1 and its surrounding constituents may apply.Like the first crack sensing line CD1, the second crack sensing line CD2may also overlap the dummy pattern layer and the dummy pattern layer mayhave a higher resistance than the second crack sensing line CD2. In thiscase, the second crack sensing line CD2 is connected to the dummypattern layer.

Next, the display area of the display device, according to an exemplaryembodiment of the present inventive concept, will be described withreference to FIG. 5.

FIG. 5 is a cross-sectional view showing a display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept.

As shown in FIG. 5, the buffer layer 120 is disposed in the display areaDA of the substrate 110 of the display device. The buffer layer 120 mayinclude a silicon nitride and/or a silicon oxide. The buffer layer 120may prevent penetration of a foreign component such as impurities ormoisture, and the buffer layer 120 may also planarize the surface of thesubstrate 110. The buffer layer 120 may be disposed in both the displayarea DA and the non-display area NDA. According to some exemplaryembodiments of the present inventive concept, the buffer layer 120 maybe entirely omitted.

A semiconductor 130 is disposed on the buffer layer 120. Thesemiconductor 130 may be made of a polycrystalline semiconductormaterial and/or an oxide semiconductor material. The semiconductor 130includes a channel region 131 and contact doping regions 132 and 133disposed at respective sides of the channel region 131. The contactdoping regions 132 and 133 may be doped with an impurity. The contactdoping regions 132 and 133 may each include a source region 132 and adrain region 133. Here, a kind of the impurity used is changed dependingon the kind of the thin film transistor being produced.

The dummy pattern layer 138 disposed in the non-display area NDA may bedisposed on the same layer as the semiconductor 130, which is disposedin the display area DA. The dummy pattern layer 138 and thesemiconductor 130 may be formed together using the same material.

The first gate insulating layer 141 is disposed on the semiconductor130. The first gate insulating layer 141 may be made of the inorganicinsulating material such as a silicon nitride and/or a silicon oxide.The first gate insulating layer 141 may be disposed in both the displayarea DA and the non-display area NDA of the substrate 110.

A gate electrode 150 is disposed on the first gate insulating layer 141.For example, the gate electrode 150 overlaps at least part of thesemiconductor 130, for example, the gate electrode 150 may overlap atleast part of the channel region 131.

The second gate insulating layer 142 is disposed on the gate electrode150 and the first gate insulating layer 141. The second gate insulatinglayer 142 may be made of the inorganic insulating material such as asilicon nitride and/or a silicon oxide. The second gate insulating layer142 may be disposed in both the display area DA and the non-display areaNDA of the substrate 110.

The interlayer insulating layer 160 is disposed on the second gateinsulating layer 142. The interlayer insulating layer 160 may be made ofthe inorganic insulating material or the organic insulating material.The interlayer insulating layer 160 may be disposed in both the displayarea DA and the non-display area NDA of the substrate 110.

The first gate insulating layer 141, the second gate insulating layer142, and the interlayer insulating layer 160 have contact holes 162 and164 overlapping at least part of the semiconductor 130. The contactholes 162 and 164 may expose the contact doping regions 132 and 133 ofthe semiconductor 130.

A source electrode 173 and a drain electrode 175 are disposed on theinterlayer insulating layer 160. The source electrode 173 is connectedto the source region 132 of the semiconductor 130 through the contacthole 162, and the drain electrode 175 is connected to the drain region133 of the semiconductor 130 through the contact hole 164.

The connection electrode 178 disposed in the non-display area NDA may bedisposed in the same layer as the source electrode 173 and the drainelectrode 175 disposed in the display area DA. The data lines D1, D2,D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dmmay be disposed in the same layer as the source electrode 173 and thedrain electrode 175. For example, the connection electrode 178 may bedisposed in the same layer as the data lines D1, D2, D3, D4, D5, D6 . .. , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm. The connectionelectrode 178, the source electrode 173, the drain electrode 175, andthe data lines D1, D2, D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3),D(m-2), D(m-1), and Dm may be formed together using the same material.

As described above, the semiconductor 130, the gate electrode 150, thesource electrode 173, and the drain electrode 175 form one thin filmtransistor. A configuration of the thin film transistor is not limitedto the above-described example, and can be changed in various ways.

A passivation layer 180 is disposed on the thin film transistor and theinterlayer insulating layer 160. The passivation layer 180 may be usedto increase emission efficiency of an organic light emitting diode(OLED) to be formed thereon. The passivation layer 180 may also serve toprovide planarization. The passivation layer 180 has a contact hole 182overlapping at least part of the drain electrode 175.

The passivation layer 180 may be made of an acrylic resin, an epoxyresin, a phenolic resin, a polyamide resin, a polyimide resin, anunsaturated polyesters resin, a polyphenylene resin, a polyphenylenesulfide resin, and/or benzocyclobutene (BCB).

A first electrode 191 is disposed on the passivation layer 180. Thefirst electrode 191 may be made of a transparent conductive materialsuch as indium-tin oxide (ITO), indium-zinc oxide (IZO), zinc oxide(ZnO), and/or indium oxide (In₂O₃), and/or a reflective metal such aslithium (Li), calcium (Ca), lithium fluoride/calcium (LiF/Ca), lithiumfluoride/aluminum (LiF/Al), aluminum (Al), silver (Ag), magnesium (Mg),and/or gold (Au). The first electrode 191 is electrically connected tothe drain electrode 175 of the thin film transistor through the contacthole 182 formed in the passivation layer 180. The first electrode 191may be an anode of the organic light emitting diode (OLED).

The first electrode 191 may include a first transparent electrode and asecond transparent electrode that are made of a transparent conductivematerial, and a transflective layer disposed between the firsttransparent electrode and the second transparent electrode and used toform a microcavity along with a second electrode 270. For example, thefirst electrode 191 may be made of a multilayer including a layer madeof the transparent conductive material and a layer made of a reflectivemetal.

A pixel definition layer 350 is disposed on the passivation layer 180and an edge of the first electrode 191. The pixel definition layer 350has a pixel opening 351 that does not cover the first electrode 191. Thepixel definition layer 350 encloses the edge of the first electrode 191.The pixel definition layer 350 may include a resin such as a polyacrylicor a polyimide, or a silica-based inorganic material.

An organic emission layer 370 is formed in the pixel opening 351 of thepixel definition layer 350. The organic emission layer 370 is formed ina plurality of layers including an emission layer, a hole-injectionlayer (HIL), a hole-transporting layer (HTL), an electron-transportinglayer (ETL), and/or an electron-injection layer (EIL). When the organicemission layer 370 includes all of the layers, the hole-injection layeris disposed on the first electrode 191 as the anode, and thehole-transporting layer, the emission layer, the electron-transportinglayer, and the electron-injection layer may be sequentially stackedthereon.

The organic emission layer 370 may include a red emitting layer emittingred light, a green emitting layer emitting green light, and a blueemitting layer emitting blue light. The red emitting layer, the greenemitting layer, and the blue emitting layer are respectively formed on ared pixel, a green pixel, and a blue pixel so that a color image may bedisplayed by the combination of red, green, and blue light.

Further, the red organic emission layer, the green organic emissionlayer, and the blue organic emission layer are integrally stacked in theorganic emission layer 370 together with the red pixel, the green pixel,and the blue pixel to respectively form a red color filter, a greencolor filter, and a blue color filter in each pixel so that a colorimage may be displayed by the combination of red, green, and blue light.Alternatively, a white organic emission layer emitting white light isformed on each of the red pixel, the green pixel, and the blue pixel,and a red color filter, a green color filter, and a blue color filterare respectively formed for each pixel so that a color image may bedisplayed by the combination of red, green, and blue light. When thecolor image is implemented by using the white organic emission layer andthe color filter, a deposition mask for depositing the red organicemission layer, the green organic emission layer, and the blue organicemission layer on individual pixels, for example, the red pixel, thegreen pixel, and the blue pixel, is not required.

The white organic emission layer described herein may be formed to havea single organic emission layer, and may further include a configurationin which a plurality of organic emission layers are stacked to emitwhite light. For example, a configuration in which at least one yelloworganic emission layer and at least one blue organic emission layer arecombined to emit white light, a configuration in which at least one cyanorganic emission layer and at least one red organic emission layer arecombined to emit white light, and a configuration in which at least onemagenta organic emission layer and at least one green organic emissionlayer are combined to emit white light may be further included.

The second electrode 270 is disposed on the pixel definition layer 350and the organic emission layer 370. The second electrode 270 isconnected to the common voltage line ELVSS, thereby receiving a commonvoltage. The second electrode 270 may be made of the transparentconductive material such as indium-tin oxide (ITO), indium-zinc oxide(IZO), zinc oxide (ZnO), and/or indium oxide (In₂O₃), and/or thereflective metal such as lithium (Li), calcium (Ca), lithiumfluoride/calcium (LiF/Ca), lithium fluoride/aluminum (LiF/Al), aluminum(Al), silver (Ag), magnesium (Mg), and/or gold (Au). The secondelectrode 270 may be a cathode of the organic light emitting diode(OLED). The first electrode 191, the organic emission layer 370, and thesecond electrode 270 may form the organic light emitting diode (OLED).

The display device, according to an exemplary embodiment of the presentinventive concept, may further include a first capacitor electrode 159a, disposed between the first gate insulating layer 141 and the secondgate insulating layer 142, and a second capacitor electrode 159 b,disposed on the second gate insulating layer 142.

The first capacitor electrode 159 a and the second capacitor electrode159 b may overlap each other. The second gate insulating layer 142 isdisposed between the first capacitor electrode 159 a and the secondcapacitor electrode 159 b. For example, two electrodes 159 a and 159 bmay overlap each other via the second gate insulating layer 142, whichis made of the insulating material, thereby forming the capacitor. Forexample, the second gate insulating layer 142 may function as adielectric material.

The first crack sensing line CD1 disposed in the non-display area NDAmay be disposed in the same layer as the second capacitor electrode 159b, which is disposed in the display area DA. The first crack sensingline CD1 and the second capacitor electrode 159 b may be formed togetherusing the same material.

Next, an operation of the display device, according to an exemplaryembodiment of the present inventive concept, will be described withreference to FIG. 6.

FIG. 6 is a waveform diagram of signals applied to a display deviceaccording to an exemplary embodiment of the present inventive concept.

As shown in FIG. 6, if the gate-on signal is applied to the first testgate line TG1 during a first time h1, then the first switching elementQ1 enters a turned-on state. The first voltage V1 applied to the firsttest signal line TD1 is transmitted to each of the plurality of datalines D1, D2, D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2),D(m-1), and Dm that are connected to the first switching element Q1through the first switching element Q1. The first voltage V1 may be avoltage to display a highest gray level by the plurality of pixels R, G,and B. If the first voltage V1 is applied to the plurality of data linesD1, D2, D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1),and Dm, then the voltage Vp1 of the plurality of pixels R, G, and Bbecomes the first voltage V1, thereby displaying white.

After a gate-off signal is applied to the first test gate line TG1, ifthe gate-on signal is applied to the second test gate line TG2 duringthe second time h2, then the second switching element Q2 enters theturned-on state. The second voltage V2 applied to the second test signallines TD2 a, TD2 b, and TD2 c, is transmitted to the plurality of datalines D1, D2, D3, D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2),D(m-1), and Dm. The second voltage V2 may be a voltage to display alowest gray level by the plurality of pixels R, G, and B. If the secondvoltage V2 is applied to each of the plurality of data lines D1, D2, D3,D4, D5, D6 . . . , D(m-5), D(m-4), D(m-3), D(m-2), D(m-1), and Dm, thenthe voltage Vp1 of the plurality of pixels R, G, and B becomes thesecond voltage V2, thereby displaying black.

If a crack forms in the non-display area NDA of the substrate 110, thefirst crack sensing line CD1 or the second crack sensing line CD2 may bedamaged.

The first crack sensing line CD1 is connected to the first data line D2.If the crack forms in the non-display area NDA of the substrate 110, thefirst crack sensing line CD1 may be damaged, and the resistance of thefirst data line D2 increases. Accordingly, the voltage Vp2 of the pixel(G) connected to the first data line D2 reaches the second voltage V2,thereby causing a voltage difference (ΔV) of the second voltage V2. Thepixel (G) connected to the first data line D2 does not display thelowest gray level by the voltage difference (ΔV), but displays a highergray level than the lowest gray level. Accordingly, if the crack formsin the non-display area NDA of the substrate 110, a bright line may berecognized along the first data line D2. For example, through therecognition of the bright line along the first data line D2, the crackof the non-display area NDA of the substrate 110 may be detected.

The second crack sensing line CD2 is connected to the second data lineD(m-1). If the crack forms in the non-display area NDA of the substrate110, the second crack sensing line CD2 may be damaged, and thereby theresistance of the second data line D(m-1) increases. Accordingly, thevoltage Vp2 of the pixel (G) connected to the second data line D(m-1)does not reach the second voltage V2, and the voltage difference (ΔV) ofthe second voltage V2 is generated. The pixel (G) connected to thesecond data line D(m-1) does not display the lowest gray level by thevoltage difference (ΔV), but displays the higher gray level than thelowest gray level. Accordingly, if the crack forms in the non-displayarea NDA of the substrate 110, a bright line may be recognized along thesecond data line D(m-1). For example, through the recognition of thebright line along the second data line D(m-1), the crack of thenon-display area NDA of the substrate 110 may be detected.

Next, a connection position where the first crack sensing line CD1 andthe second crack sensing line CD2 are connected to the dummy patternlayer in the display device, according to an exemplary embodiment of thepresent inventive concept, will be described with reference to FIG. 7 toFIG. 9.

FIG. 7 to FIG. 9 are top plan views illustrating a display deviceaccording to an exemplary embodiment of the present inventive concept.

As shown in FIG. 7, the connection position CP where the first cracksensing line CD1 and the second crack sensing line CD2 are connected tothe dummy pattern layer may be disposed at a left upper end, a leftlower end, a right upper end, and a right lower end of the displaydevice. As previously described, a part extending in the seconddirection R2 of the first crack sensing line CD1 and the second cracksensing line CD2 may be connected to the dummy pattern layer. Howeveralternatively, a part extending in the first direction R1 of the firstcrack sensing line CD1 and the second crack sensing line CD2 may beconnected to the dummy pattern layer.

As shown in FIG. 8, the connection position CP where the first cracksensing line CD1 and the second crack sensing line CD2 are connected tothe dummy pattern layer may be disposed at a left center or a rightcenter of the display device.

As shown in FIG. 9, the connection position CP where the first cracksensing line CD1 and the second crack sensing line CD2 are connected tothe dummy pattern layer may be continuously disposed along a left edgeand a right edge of the display device. A position and a number ofconnection positions CP, and a distance between adjacent connectionpositions CP, may be variously changed.

Next, the display device, according to an exemplary embodiment of thepresent inventive concept, will be described with reference to FIG. 10.

The display device, according to an exemplary embodiment of the presentinventive concept, shown in FIG. 10 may be substantially similar to thedisplay device shown in FIG. 1 to FIG. 9. Thus, to the extent that adetailed description of various elements is omitted, it may be assumedthat these elements are similar to or the same as the correspondingelements of FIG. 1 to FIG. 9. However, the approach of FIG. 10 isdifferent from the previously-described approach in that the first cracksensing line protrudes at a particular point.

FIG. 10 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept.

As shown in FIG. 10, the first crack sensing line CD1 extends inparallel to the common voltage line ELVSS and overlaps the dummy patternlayer 138. The connection electrode 178 is parallel to the first cracksensing line CD1 and overlaps the dummy pattern layer 138.

The first crack sensing line CD1 includes a protrusion CD1 a protrudedtoward the common voltage line ELVSS, and the protrusion CD1 a overlapsthe connection electrode 178. The protrusion CD1 a of the first cracksensing line CD1 is connected to the connection electrode 178 throughthe first contact hole 185. The dummy pattern layer 138 is connected tothe connection electrode 178 through the second contact hole 186.Accordingly, the first crack sensing line CD1 is connected to the dummypattern layer 138 through the connection electrode 178.

Next, the display device, according to an exemplary embodiment of thepresent inventive concept, will be described with reference to FIG. 11.

The display device, according to an exemplary embodiment of the presentinventive concept, shown in FIG. 11 may be similar to the display deviceshown in FIG. 1 to FIG. 9. Any omitted details may be assumed to be thesame as corresponding elements of the configuration discussed above.However, in the configuration shown in FIG. 11, the dummy pattern layerand the connection electrode are connected through the plurality ofsecond contact holes.

FIG. 11 is a top plan view showing a non-display area of a displaydevice, according to an exemplary embodiment of the present inventiveconcept.

As shown in FIG. 11, the protrusion CD1 a of the first crack sensingline CD1 is connected to the connection electrode 178 through one firstcontact hole 185. The dummy pattern layer 138 is connected to theconnection electrode 178 through two second contact holes 186. A numberof the first contact holes 185 to connect the first crack sensing lineCD1 and the connection electrode 178 may be variously changed. Likewise,a number of the second contact holes 186 to connect the dummy patternlayer 138 and the connection electrode 178 may be variously changed.

Next, the display device, according to an exemplary embodiment of thepresent inventive concept, will be described with reference to FIG. 12and FIG. 13.

The display device, according to an exemplary embodiment of the presentinventive concept, and shown in FIG. 12 and FIG. 13 may be substantiallysimilar to the display device shown in FIG. 1 to FIG. 9. It maytherefore be assumed that any omitted details are the same ascorresponding elements described above. However, the configuration ofFIG. 12 and FIG. 13 are different in that the connection electrode isconnected to the dummy pattern layer and the first crack sensing linethrough one contact hole.

FIG. 12 is a top plan view showing a non-display area of a displaydevice, according to an exemplary embodiment of the present inventiveconcept, and FIG. 13 is a cross-sectional view of a non-display area ofFIG. 12 taken along a line XIII-XIII.

As shown in FIG. 12 and FIG. 13, the dummy pattern layer 138 is disposedon the substrate 110, and the first gate insulating layer 141 and thesecond gate insulating layer 142 are deposited on the dummy patternlayer 138. The first crack sensing line CD1 is disposed on the secondgate insulating layer 142, and the interlayer insulating layer 160 isdisposed on the first crack sensing line CD1. The first gate insulatinglayer 141, the second gate insulating layer 142, and the interlayerinsulating layer 160 have a third contact hole 187 that overlaps thefirst crack sensing line CD1 and the dummy pattern layer 138. The edgeupper surface and the side surface of the first crack sensing line CD1are exposed by the third contact hole 187, and the upper surface of thedummy pattern layer 138 is exposed.

The connection electrode 178 is disposed on the interlayer insulatinglayer 160. The connection electrode 178 is connected to the first cracksensing line CD1 and the dummy pattern layer 138 though the thirdcontact hole 187. In this case, the connection electrode 178 is incontact with the upper surface and the side surface of the first cracksensing line CD1 in the third contact hole 187 and is in contact withthe upper surface of the dummy pattern layer 138. The first cracksensing line CD1 is connected to the dummy pattern layer 138 through theconnection electrode 178.

Next, the display device, according to an exemplary embodiment of thepresent inventive concept, will be described with reference to FIG. 14and FIG. 15.

The display device, according to the exemplary embodiment of the presentinventive concept, and shown in FIG. 14 and FIG. 15 may be substantiallysimilar to the display device shown in FIG. 1 to FIG. 9. It may beassumed that any omitted description is substantially the same as thatof corresponding elements previously described. However, in the approachof FIG. 14 and FIG. 15, the connection electrode is connected to thedummy pattern layer and the first crack sensing line through one contacthole.

FIG. 14 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept, and FIG. 15 is a cross-sectional view illustrating anon-display area of FIG. 14 taken along a line XV-XV.

As shown in FIG. 14 and FIG. 15, the dummy pattern layer 138 is disposedon the substrate 110, and the first gate insulating layer 141 and thesecond gate insulating layer 142 are deposited on dummy pattern layer138. The first crack sensing line CD1 is disposed on the second gateinsulating layer 142, and the interlayer insulating layer 160 isdisposed on the first crack sensing line CD1. A fourth contact hole 188penetrating the first gate insulating layer 141, the second gateinsulating layer 142, the first crack sensing line CD1, and theinterlayer insulating layer 160 are formed in the part overlapping thedummy pattern layer 138. The side surface of the first crack sensingline CD1 and the upper surface of the dummy pattern layer 138 areexposed by the fourth contact hole 188.

The connection electrode 178 is disposed on the interlayer insulatinglayer 160. The connection electrode 178 is connected to the first cracksensing line CD1 and the dummy pattern layer 138 through the fourthcontact hole 188. In this case, the connection electrode 178 is incontact with the side surface of the first crack sensing line CD1 andthe upper surface of the dummy pattern layer 138 in the fourth contacthole 188. The first crack sensing line CD1 is connected to the dummypattern layer 138 through the connection electrode 178.

Next, the display device, according to an exemplary embodiment of thepresent inventive concept, will be described with reference to FIG. 16and FIG. 17.

The display device, according to the exemplary embodiment of the presentinventive concept, and shown in FIG. 16 and FIG. 17 may be substantiallythe same as the display device shown in FIG. 1 to FIG. 9. To the extentthat details are omitted, it may be assumed that these omitted detailsare substantially the same as the corresponding elements describedabove. According to the configuration of FIG. 16 and FIG. 17, theconnection electrode is not formed.

FIG. 16 is a top plan view illustrating a non-display area of a displaydevice according to an exemplary embodiment of the present inventiveconcept, and FIG. 17 is a cross-sectional view illustrating anon-display area of FIG. 16 taken along a line XVII-XVII.

As shown in FIG. 16 and FIG. 17, the dummy pattern layer 138 is disposedon the substrate 110, and the first gate insulating layer 141 and thesecond gate insulating layer 142 are deposited on the dummy patternlayer 138. The first gate insulating layer 141 and the second gateinsulating layer 142 have a fifth contact hole 189 overlapping the dummypattern layer 138. The dummy pattern layer 138 is exposed by the fifthcontact hole 189.

The first crack sensing line CD1 is disposed on the second gateinsulating layer 142. The first crack sensing line CD1 is directlyconnected to the dummy pattern layer 138 through the fifth contact hole189.

Next, the display device, according to an exemplary embodiment of thepresent inventive concept, will be described with reference to FIG. 18.

The display device, according to the exemplary embodiment of the presentinventive concept, and shown in FIG. 18 may be substantially the same asthe display device shown in FIG. 1 to FIG. 9. It may be assumed that anyomitted description may be similar to corresponding elements previouslydescribed. According to the approach of FIG. 18, the first crack sensingline is disposed in the same layer as the gate electrode.

FIG. 18 is a cross-sectional view showing a non-display area of adisplay device according to an exemplary embodiment of the presentinventive concept.

As shown in FIG. 18, the dummy pattern layer 138 is disposed on thesubstrate 110 and the first gate insulating layer 141 is disposed on thedummy pattern layer 138. The first crack sensing line CD1 is disposed onthe first gate insulating layer 141, and the second gate insulatinglayer 142 and the interlayer insulating layer 160 are deposited on thefirst crack sensing line CD1. The second gate insulating layer 142 andthe interlayer insulating layer 160 have the first contact hole 185overlapping the first crack sensing line CD1. The first gate insulatinglayer 141, the second gate insulating layer 142, and the interlayerinsulating layer 160 have the second contact hole 186 overlapping thedummy pattern layer 138.

The connection electrode 178 is disposed on the interlayer insulatinglayer 160. The connection electrode 178 is connected to the first cracksensing line CD1 through the first contact hole 185. The connectionelectrode 178 is connected to the dummy pattern layer 138 through thesecond contact hole 186. The first crack sensing line CD1 is connectedto the dummy pattern layer 138 through the connection electrode 178.

As described above, the first crack sensing line CD1 disposed in thenon-display area (NDA of FIG. 1) is disposed in the same layer as thesecond capacitor electrode (159 b of FIG. 5) disposed in the displayarea (DA of FIG. 1). The first crack sensing line CD1 disposed in thenon-display area (NDA of FIG. 1) may be disposed in the same layer asthe gate electrode (150 of FIG. 5) disposed in the display area (DA ofFIG. 1). The first crack sensing line CD1 may be disposed in the samelayer as the gate lines (G1, G2 . . . , G(n-1), Gn of FIG. 1) of thedisplay area (DA of FIG. 1), and the first capacitor electrode (159 a ofFIG. 5). The first crack sensing area CD1, the gate electrode (150 ofFIG. 5), the gate line (G1, G2 . . . , G(n-1), Gn of FIG. 1), and thefirst capacitor electrode (159 a of FIG. 5) may be formed together usingthe same material.

While this disclosure has been described in connection with exemplaryembodiments of the present inventive concept, it is to be understoodthat the invention is not limited to the disclosed embodiments, but, onthe contrary, is intended to cover various modifications and equivalentarrangements.

What is claimed is:
 1. A display device comprising: a substrateincluding a display area aid a non-display area; a plurality of pixelsdisposed in the display area of the substrate; a plurality of data linesconnected to the plurality of pixels; a crack sensing line connected toat least one of the plurality of data lines, the crack sensing linedisposed in the non-display area of the substrate; a dummy pattern layerconnected to the crack sensing line, the dummy pattern layer having ahigher resistance than the crack sensing line; and wherein the cracksensing line overlaps the dummy pattern layer in a cross-sectional view,wherein the crack sensing line and the dummy pattern layer cause an RCdelay to reduce a peak current in the crack sensing line when staticelectricity is present in the crack sensing line, wherein the dummypattern layer is electrically connected to the crack sensing line by aconnection electrode that overlaps an interlayer insulating layer thatis disposed over the crack sensing line and the dummy pattern layer,wherein the interlayer insulating layer is diposed between the cracksensing line and the connection electrode, wherein the interlayerinsulating layer is disposed beteen the dummy pattern layer and theconnection electrode, and wherein the connection electrode is made ofthe same material as the plurality of data lines.
 2. The display deviceof claim 1, further comprising a common voltage line disposed in thenon-display area of the substrate, adjacent to both the crack sensingline and the dummy pattern layer.
 3. The display device of claim 2,wherein the crack sensing line and the dummy pattern layer each extendin parallel with the common voltage line.
 4. The display device of claim1, wherein the connection electrode at least partially overlaps each ofthe crack sensing line and the dummy pattern layer, and the dummypattern layer includes a semiconductor material.
 5. The display deviceof claim 1, further comprising: a semiconductor disposed in the displayarea of the substrate; a gate electrode overlapping the semiconductor;and a source electrode and a drain electrode, each connected to thesemiconductor and separated from each other.
 6. The display device ofclaim 5, wherein the crack sensing line is made of the same material asthe gate electrode, and the dummy pattern layer is made of the samematerial as the semiconductor.
 7. The display device of claim 5, furthercomprising: a first capacitor electrode and a second capacitor electrodeeach disposed in the display area of the substrate and at leastpartially overlapping each other, wherein the crack sensing line is madeof the same material as the first capacitor electrode, wherein the gateelectrode is made of the same material as the second capacitorelectrode, and wherein the dummy pattern layer is made of the samematerial as the semiconductor.
 8. The display device of claim 1, furthercomprising: a first test gate line and a first test signal line eachdisposed in the non-display area of the substrate; and a first switchingelement connected to the first test gate line, the first test signalline, and the plurality of data lines.
 9. The display device of claim 8,further comprising: a second test gate line and a second test signalline each disposed in the non-display area of the substrate; and asecond switching element connected to the second test gate line, thesecond test signal line, and the at least one of the plurality of datalines.
 10. The display device of claim 9, wherein the plurality of datalines receive a first voltage from the first test signal line when agate-on voltage is applied to the first test gate line, and theplurality of data lines receive a second voltage, that is different fromthe first voltage, from the second test signal line when the gate-onvoltage is applied to the second test gate line.
 11. The display deviceof claim 10, wherein the gate-on voltage is applied to the first testgate line during a first time, and the gate-on voltage is applied to thesecond test gate line during a second time, the second time occurringafter the first time.
 12. The display device of claim 9, wherein thecrack sensing line is connected to the at least one of the plurality ofdata lines through the second switching element.
 13. A display devicecomprising: a substrate including a display area and a non-display area;a plurality of pixels disposed in the display area of the substrate; aplurality of data lines connected to the plurality of pixels; a cracksensing line connected to at least one of the plurality of data lines,the crack sensing line disposed in the non-display area of thesubstrate; a dummy pattern layer connected to the crack sensing line; aconnection electrode at least partially overlapping each of the cracksensing line and the dummy pattern layer; a gate insulating layerdisposed between the dummy pattern layer and the crack sensing line anddisposed between the dummy pattern layer and the connection electrode;an interlayer insulating layer disposed between the crack sensing lineand the connection, electrode and disposed between the dummy patternlayer and the connection electrode; a first contact hole formed in theinterlayer insulating layer and at least partially overlapping the cracksensing line; and a second contact hole formed in the interlayerinsulating layer and the gate insulating layer an at least partiallyoverlapping the dummy pattern layer, wherein the crack sensing line andthe dummy pattern layer are connected to each other by the connectionelectrode, and wherein the connection electrode is connected to thecrack sensing line through the first contact hole and is connected tothe dummy pattern layer through the second contact hole.
 14. A displaydevice comprising: a substrate including a display area and anon-display area; a plurality of pixels disposed in the display area ofthe substrate; a plurality of data lines connected to the plurality ofpixels; a crack sensing line connected to at least one of the pluralityof data lines, the crack sensing line disposed in the non-display areaof the substrate; and a dummy pattern layer connected to the cracksensing line, the dummy pattern layer having a higher resistance thanthe crack sensing line, wherein the crack sensing line overlaps thedummy pattern layer in a cross-sectional view and does not directlycontact the dummy pattern layer, wherein the crack sensing line and thedummy pattern layer cause an RC delay to reduce a peak current in thecrack sensing line when static electricity is present in the cracksensing line; a connection electrode at least partially overlapping eachof the crack sensing line and the dummy pattern layer, and wherein thecrack sensing line and the dun pattern layer are connected to each otherby the connection electrode; a gate insulating disposed between thedummy pattern layer and the crack sensing line and disposed between thedummy pattern layer and the connection electrode; an interlayerinsulating layer disposed between the crack sensing line and theconnection electrode and disposed between the dummy pattern layer andthe connection electrode; and a third contact hole formed in theinterlayer insulating layer and the gate insulating layer an at leastpartially overlapping the crack sensing line and the dummy patternlayer, wherein the connection electrode is connected to the cracksensing line and the dummy pattern layer through the third contact hole.15. The display device of claim 14, wherein the connection electrode isin contact with an upper surface and a side surface of the crack sensingline in the third contact hole.
 16. A display device comprising: asubstrate including a display area and a non-display area; a pluralityof pixels disposed in the display area of the substrate; a plurality ofdata lines connected to the plurality of pixels; a crack sensing lineconnected to at least one of the plurality of data lines, the cracksensing line disposed in the non-display area of the substrate; and adummy pattern layer connected to the crack sensing line, the dummypattern layer having a higher resistance than the crack sensing line,wherein the crack sensing line overlaps the dummy pattern layer in across-sectional view and does not directly contact the dummy patternlayer, wherein the crack sensing line and the dummy pattern layer causean RC delay to reduce a peak current in the crack sensing line whenstatic electricity is present in the crack sensing line; a connectionelectrode at least partially overlapping each of the crack sensing lineand the dummy pattern layer, and wherein the crack sensing line and thedummy pattern layer are connected to each other by the connectionelectrode; a gate insulating layer disposed between the dummy patternlayer and the crack sensing line; an interlayer insulating layerdisposed between the crack sensing line and the connection electrode;and a fourth contact hole penetrating the gate insulating layer, thecrack sensing line, and the interlayer insulating layer within an areaoverlapping the dummy pattern layer, wherein the connection electrode isconnected to the crack sensing line and the dummy pattern layer throughthe fourth contact hole.
 17. The display device of claim 16, wherein theconnection electrode is in contact with a side surface of the cracksensing line through the fourth contact hole.
 18. A display devicecomprising: a flexible substrate; a plurality of pixels disposed on theflexible substrate; a plurality of data lines disposed on the substrateand connected to the plurality of pixels; a first crack sensing lineconnected to the plurality of data lines; and a dummy pattern layerdisposed between the first crack sensing line and the flexiblesubstrate, the dummy pattern layer having a higher resistance than thefirst crack sensing line; an interlayer insulating layer covering thefirst crack sensing line and the dummy pattern layer; and a connectionelectrode over overlapping the interlayer insulating layer, the dummypattern layer, and the first crack sensing line, and electricallyconnecting the dummy pattern layer with the first crack sensing linethrough a pair of corresponding vias that each penetrate the interlayerinsulating layer, and wherein the first crack sensing line overlaps thedummy pattern layer in a cross-sectional view, wherein the first cracksensing line and the dummy pattern layer cause an RC delay to reduce apeak current in the first crack sensing line when static electricity ispresent in the first crack sensing line, wherein the interlayerinsulating layer is disposed between the first crack sensing line andthe connection electrode, wherein the interlayer insulating layer isdisposed between the dummy pattern layer and the connection electrode,and wherein the connection electrode is made of the same material as theplurality of data lines.
 19. The display device of claim 18, wherein thefirst crack sensing line causes an artifact to be displayed in thedisplay device when a crack in the substrate is detected by the firstcrack sensing line.
 20. The display device of claim 18, additionallycomprising a second crack sensing line connected to the plurality ofdata lines.